Supplemental Material: Data Summary, Plots, and Analyses

Rachel A. Searston; Matthew B Thompson; John R Vokey; Luke French; Jason M Tangen

doi:10.17605/OSF.IO/BCNKQ

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How low can you go? Detecting style in extremely low resolution images /

Supplemental Material: Data Summary, Plots, and Analyses

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Category: Analysis

Description: Includes our final R Markdown report, R Markdown source file, and data summary .txt files for reading into R Studio. To rerun the R Markdown data analytic script locally within R Studio, download all of the "mydata" .txt files, and the .rmd source file to your desktop. Raw confidence ratings, response times, hits and false alarms, folded confidence ratings, and confidence ratings coded as correct and incorrect responses from all participants in both experiments are also available in the zip folder.

License: CC-By Attribution 4.0 International

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How low can you go? Detecting style in extremely low resolution images /

Supplemental Material: Data Summary, Plots, and Analyses

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